Fabrication and Characterisation of Quantum Devices
Published: 17 Jul 2024 · Last updated: 11 Aug 2026
The performance of even the simplest element of quantum computers is dramatically impacted by subtle details of device fabrication. How can you solve the critical challenges in device fabrication for quantum devices?
Oxford Instruments, Raith, delmic and Qnami team up to share comprehensive knowledge about the fabrication and characterization of quantum devices in a joint symposium.
Working closely with the quantum community enable us to understand and solve the fabrication challenges for quantum devices. In this joint symposium, we give an overview of how to minimize losses arising from device processing as well as how to control the size of the nanomaterial with nanometre resolution. Check the Agenda below for more details.
Time (CET)
Talk Title
Presenter
9:30-9:40
Welcome and introduction
Jörg Stodolka, Raith GmbH
9:40-10:10
Supporting the development of quantum devices with Scanning NV Magnetometry
Dr Joerg Lenz, Qnami
10:10-10:40
Correlative Metrology for Emerging Nanoelectronics with Scanning Nitrogen-Vacancy Magnetometry
Dr Umberto Celano, Imec
10:40-11:10
Nanofabrication for quantum computing
Michael Kahl, Raith GmbH
11:10-11:40
Quantum optics on a chip
Menno Poot, TU München
11:40-12:40
Lunch Break
12:40-13:10
Cathodoluminescence microscopy for nanoscale optical inspection
Toon Coenen, Delmic
13:10-13:40
Investigating exciton-plasmon-photon interactions by cathodoluminescence spectroscopy
Dr Nahid Talebi, Kiel University
13:40-14:40
Superconducting Qubits: Fab to Fridge
Dr Russ Renzas, Oxford Instruments Plasma Technology